{"id":756,"date":"2021-01-01T12:00:00","date_gmt":"2021-01-01T12:00:00","guid":{"rendered":"https:\/\/grupo.us.es\/minerva\/statistically-representative-metrology-of-nanoparticles-via-unsupervised-machine-learning-of-tem-images\/"},"modified":"2021-01-01T12:00:00","modified_gmt":"2021-01-01T12:00:00","slug":"statistically-representative-metrology-of-nanoparticles-via-unsupervised-machine-learning-of-tem-images","status":"publish","type":"page","link":"https:\/\/grupo.us.es\/minerva\/statistically-representative-metrology-of-nanoparticles-via-unsupervised-machine-learning-of-tem-images\/","title":{"rendered":"Statistically Representative Metrology of Nanoparticles via Unsupervised Machine Learning of TEM Images"},"content":{"rendered":"<p><div class=\"tp_single_publication\"><span class=\"tp_single_author\">Haotian Wen, Jos\u00e9 Mar\u00eda Luna-Romera, Jos\u00e9 C. Riquelme, Christian Dwyer, Shery L. Y. Chang: <\/span> <span class=\"tp_single_title\">Statistically Representative Metrology of Nanoparticles via Unsupervised Machine Learning of TEM Images<\/span>. <span class=\"tp_single_additional\"><span class=\"tp_pub_additional_in\">En: <\/span><span class=\"tp_pub_additional_journal\">Nanomaterials, <\/span><span class=\"tp_pub_additional_volume\">vol. 11, <\/span><span class=\"tp_pub_additional_pages\">pp. 2706, <\/span><span class=\"tp_pub_additional_year\">2021<\/span>.<\/span><\/div><!--more--><\/p>\n<h2 class=\"tp_abstract\">Resumen<\/h2><p class=\"tp_abstract\"><\/p>\n<h2 class=\"tp_links\">Enlaces<\/h2><p class=\"tp_abstract\"><ul class=\"tp_pub_list\"><li><i class=\"fas fa-globe\"><\/i><a class=\"tp_pub_list\" href=\"https:\/\/doi.org\/10.3390\/nano11102706\" title=\"https:\/\/doi.org\/10.3390\/nano11102706\" target=\"_blank\">https:\/\/doi.org\/10.3390\/nano11102706<\/a><\/li><li><i class=\"ai ai-doi\"><\/i><a class=\"tp_pub_list\" href=\"https:\/\/dx.doi.org\/10.3390\/nano11102706\" title=\"DOI de seguimiento:10.3390\/nano11102706\" target=\"_blank\">doi:10.3390\/nano11102706<\/a><\/li><\/ul><\/p>\n<h2 class=\"tp_bibtex\">BibTeX (<a href=\"https:\/\/grupo.us.es\/minerva?feed=tp_pub_bibtex&amp;key=10.3390\/nano11102706\">Download<\/a>)<\/h2><pre class=\"tp_bibtex\">@article{10.3390\/nano11102706,\r\ntitle = {Statistically Representative Metrology of Nanoparticles via Unsupervised Machine Learning of TEM Images},\r\nauthor = {Haotian Wen and Jos\u00e9 Mar\u00eda Luna-Romera and Jos\u00e9 C. Riquelme and Christian Dwyer and Shery L. Y. Chang},\r\nurl = {https:\/\/doi.org\/10.3390\/nano11102706},\r\ndoi = {10.3390\/nano11102706},\r\nyear  = {2021},\r\ndate = {2021-01-01},\r\njournal = {Nanomaterials},\r\nvolume = {11},\r\npages = {2706},\r\nkeywords = {},\r\npubstate = {published},\r\ntppubtype = {article}\r\n}\r\n<\/pre>\n","protected":false},"excerpt":{"rendered":"","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-756","page","type-page","status-publish","hentry","post-item clearfix"],"_links":{"self":[{"href":"https:\/\/grupo.us.es\/minerva\/wp-json\/wp\/v2\/pages\/756","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/grupo.us.es\/minerva\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/grupo.us.es\/minerva\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/grupo.us.es\/minerva\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/grupo.us.es\/minerva\/wp-json\/wp\/v2\/comments?post=756"}],"version-history":[{"count":0,"href":"https:\/\/grupo.us.es\/minerva\/wp-json\/wp\/v2\/pages\/756\/revisions"}],"wp:attachment":[{"href":"https:\/\/grupo.us.es\/minerva\/wp-json\/wp\/v2\/media?parent=756"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}