Statistically Representative Metrology of Nanoparticles via Unsupervised Machine Learning of TEM Images – Minerva – Machine Learning – Data Science

Haotian Wen, José María Luna-Romera, José C. Riquelme, Christian Dwyer, Shery L. Y. Chang: Statistically Representative Metrology of Nanoparticles via Unsupervised Machine Learning of TEM Images. En: Nanomaterials, vol. 11, pp. 2706, 2021.

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https://doi.org/10.3390/nano11102706
doi:10.3390/nano11102706

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@article{10.3390/nano11102706,
title = {Statistically Representative Metrology of Nanoparticles via Unsupervised Machine Learning of TEM Images},
author = {Haotian Wen and José María Luna-Romera and José C. Riquelme and Christian Dwyer and Shery L. Y. Chang},
url = {https://doi.org/10.3390/nano11102706},
doi = {10.3390/nano11102706},
year  = {2021},
date = {2021-01-01},
journal = {Nanomaterials},
volume = {11},
pages = {2706},
keywords = {},
pubstate = {published},
tppubtype = {article}
}